发明名称 Device and method for imaging a multiple particle beam on a substrate
摘要 A device and a method for imaging and positioning a multiparticle beam on a substrate is disclosed. The device comprises a particle beam source with a condenser optic that produces a particle beam that illuminates the surface of an aperture plate. A multiplicity of individual beams are produced from the particle beam by means of the aperture plate, which are then projected by a projection system onto a substrate where they describe a beam base point. The substrate or target, respectively, is placed on a table that is movable along an x-coordinate and a y-coordinate, and that is provided with a laser path measurement system. The laser path measurement system relays positional data with a fixed clock rate to a synchronization and control device 50 that positions the beam base point along the x-coordinate and the y-coordinate via a beam tracking system, taking into account the corrective data and pixel phase, whereby precise staircase beam-to-table positioning is achieved across the entire substrate in spite of faulty table movement.
申请公布号 US7332730(B2) 申请公布日期 2008.02.19
申请号 US20050270073 申请日期 2005.11.09
申请人 LEICA MICROSYSTEMS LITHOGRAPHY GMBH 发明人 HEINITZ JOACHIM;SCHUBERT ANDREAS
分类号 G01N23/00;G01J1/00;H01J37/30;H01J37/317 主分类号 G01N23/00
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