| 摘要 |
A spectrometer system ( 1 ) comprising an IR (infrared) spectrometer ( 2 ) and an IR microscope ( 3 ), wherein a sample ( 42 ) and a first detector ( 21; 31 ) are provided in the IR microscope ( 3 ), wherein the IR microscope ( 3 ) is designed such that during measurement, the sample ( 42 ) is imaged on the first detector ( 21; 31 ) via an intermediate focus ( 44 ), is characterized in that at least one second detector ( 24, 25; 33 ) is provided whose detector surface ( 26, 27; 34 ) extends parallel to the detector surface ( 22; 32 ) of the first detector ( 21; 31 ), the detector surface ( 26, 27; 34 ) of the at least one second detector ( 24, 25; 33 ) is at least 5 times larger than the detector surface ( 22; 32 ) of the first detector ( 21; 31 ), and the first ( 21; 31 ) and the at least one second detector ( 24, 25; 33 ) are disposed directly next to each other, wherein the detector surface ( 26, 27; 34 ) of the at least one second detector ( 24, 25; 33 ) largely surrounds the detector surface ( 22; 32 ) of the first detector ( 21, 31 ), and the first detector ( 21; 31 ) can be read out independently of the at least one second detector ( 24, 25; 33 ). The inventive spectrometer system yields a good signal-to-noise ratio both for large and small selected sample areas.
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