| 摘要 |
A method for fabricating a glass substrate containing SiO<SUB>2 </SUB>as a main ingredient thereof and having a uniform and minute pattern of stripes formed on the surface thereof by ultraprecision polishing includes a step of inspecting whether or not, at the topmost surface portion of the glass substrate after polishing, a given property of a bound energy of the Si atom with respect to the electrons occupying a 2P orbit as determined by XPS is equal to or less than a predetermined value, and the given property is a shift amount of the bound energy or a half-value width of the bound energy distribution, the predetermined value is 0.10 eV or 2.15 eV, respectively.
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