发明名称 |
Back illuminated image sensor with an uniform substrate temperature |
摘要 |
<p>The sensor has a semiconductor material substrate (14) with N and P-type regions (34, 38), on a side of its front surface (15), corresponding to power terminals of MOS transistors (M7, M8) of peripheral circuits with a significant heat dissipation. A stack of insulating layers (70) covers the surface, and a thermally conductive silicon reinforcement (78) covers the stack on the side opposite to the substrate. Thermally conductive vias (76) connects the substrate to the reinforcement, where the sensor is made in monolithic form and illuminated on a side of a rear surface (16) of the substrate. An independent claim is also included for a method for manufacturing an image sensor.</p> |
申请公布号 |
EP1883112(A1) |
申请公布日期 |
2008.01.30 |
申请号 |
EP20070112649 |
申请日期 |
2007.07.17 |
申请人 |
ST MICROELECTRONICS S.A.;COMMISSARIAT A L'ENERGIE ATOMIQUE;STMICROELECTRONICS (CROLLES 2) SAS |
发明人 |
CAZAUX, YVON;CORONEL, PHILIPPE;FENOUILLET-BERANGER, CLAIRE;ROY, FRANCOIS |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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