| 摘要 |
Systems (100) and methods of testing integrated circuits (130) are disclosed. The systems (100) include a test module (120) configured to operate between automated testing equipment (110) and an integrated circuit to be tested (130). The testing interface (120) is configured to test the integrated circuit at a higher clock frequency than the automated testing equipment (110) is configured to operate. In order to do so, the testing interface (120) includes components configured for generating addresses and test data to be provided to the integrated circuit (130). A variety of test data patterns can be produced and the test data can be addressed dependent.
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