发明名称 ANALOG SET TOP CALIBRATION PATTERNS IN MANUFACTURING
摘要 Included are systems and methods for performing a functionality test to an STT. At least one embodiment of a method includes storing at least one test pattern in a storage device, decoding the at least one stored test pattern, and sending the test pattern from a output port to an input port, the input port being coupled to at least one tuning device. Other embodiments include tuning, via the at least one tuning device, the STT according to the test pattern and converting the decoded test pattern to at least one output signal.
申请公布号 WO2008002798(A2) 申请公布日期 2008.01.03
申请号 WO2007US71547 申请日期 2007.06.19
申请人 SCIENTIFIC-ATLANTA, INC.;MONTREUIL, LEO;WILLIAMS, WAYNE B.;RUSS, SAMUEL H.;KRIETE, ROBERT A. 发明人 MONTREUIL, LEO;WILLIAMS, WAYNE B.;RUSS, SAMUEL H.;KRIETE, ROBERT A.
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