APPARATUS AND METHOD FOR IN SITU AND EX SITU MEASUREMENT OF SPATIAL IMPULSE RESPONSE OF AN OPTICAL SYSTEM USING PHASE-SHIFTING POINT-DIFFRACTION INTERFEROMETRY,申请号EP20060799903-传众专利搜索

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发明名称	APPARATUS AND METHOD FOR IN SITU AND EX SITU MEASUREMENT OF SPATIAL IMPULSE RESPONSE OF AN OPTICAL SYSTEM USING PHASE-SHIFTING POINT-DIFFRACTION INTERFEROMETRY
摘要
申请公布号	EP1869399(A2)	申请公布日期	2007.12.26
申请号	EP20060799903	申请日期	2006.04.10
申请人	ZETETIC INSTITUTE	发明人	HILL, HENRY, A.
分类号	G01B9/02	主分类号	G01B9/02
代理机构		代理人
主权项
地址

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