发明名称 |
Method for manufacturing semiconductor device |
摘要 |
When forming a conductive film by a method comprising sputtering after grinding the back surface of a semiconductor substrate, in order to avoid discharge from a part of an adhesive flown out at the outer periphery of the substrate, wherein the adhesive is used to fix the substrate to a support during grinding, at least the substrate end or the adhesive is removed after grinding the semiconductor substrate and before forming the conductive film, so that a gap between the substrate end and the adhesive may have a predetermined size. |
申请公布号 |
US8853005(B2) |
申请公布日期 |
2014.10.07 |
申请号 |
US201113227518 |
申请日期 |
2011.09.08 |
申请人 |
PS4 Luxco S.a.r.l. |
发明人 |
Fujii Seiya |
分类号 |
H01L21/00;H01L21/30;H01L21/44;H01L21/768;H01L23/48 |
主分类号 |
H01L21/00 |
代理机构 |
Sughrue Mion, PLLC |
代理人 |
Sughrue Mion, PLLC |
主权项 |
1. A method for manufacturing a semiconductor device comprising:
fixing a semiconductor substrate to a support having an external diameter greater than that of the semiconductor substrate by use of an adhesive; and forming a conductive film on the semiconductor substrate by a method comprising at least sputtering after fixing the semiconductor substrate to the support; wherein before forming the conductive film, a gap between the semiconductor substrate and the adhesive flown out from the outer periphery of the semiconductor substrate is enlarged to a predetermined size by removing at least one of the semiconductor substrate and the adhesive. |
地址 |
Luxembourg LU |