发明名称 Method for manufacturing semiconductor device
摘要 When forming a conductive film by a method comprising sputtering after grinding the back surface of a semiconductor substrate, in order to avoid discharge from a part of an adhesive flown out at the outer periphery of the substrate, wherein the adhesive is used to fix the substrate to a support during grinding, at least the substrate end or the adhesive is removed after grinding the semiconductor substrate and before forming the conductive film, so that a gap between the substrate end and the adhesive may have a predetermined size.
申请公布号 US8853005(B2) 申请公布日期 2014.10.07
申请号 US201113227518 申请日期 2011.09.08
申请人 PS4 Luxco S.a.r.l. 发明人 Fujii Seiya
分类号 H01L21/00;H01L21/30;H01L21/44;H01L21/768;H01L23/48 主分类号 H01L21/00
代理机构 Sughrue Mion, PLLC 代理人 Sughrue Mion, PLLC
主权项 1. A method for manufacturing a semiconductor device comprising: fixing a semiconductor substrate to a support having an external diameter greater than that of the semiconductor substrate by use of an adhesive; and forming a conductive film on the semiconductor substrate by a method comprising at least sputtering after fixing the semiconductor substrate to the support; wherein before forming the conductive film, a gap between the semiconductor substrate and the adhesive flown out from the outer periphery of the semiconductor substrate is enlarged to a predetermined size by removing at least one of the semiconductor substrate and the adhesive.
地址 Luxembourg LU