发明名称 APPEARANCE INSPECTION APPARATUS AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide an appearance inspection apparatus and method which can perform accurate fault inspection in a short time. SOLUTION: A two-dimensional image of an object 3 to be inspected that is mounted on a stage 2 is photographed by a CCD camera 12. A control section 15 performs two-dimensional image processing on the photographed image to perform fault inspection. A part determined as a fault is subjected to redetermination as to whether it is a fault using its height information. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007327836(A) 申请公布日期 2007.12.20
申请号 JP20060158862 申请日期 2006.06.07
申请人 OLYMPUS CORP 发明人 RYU TAKESHI
分类号 G01B11/30;G01B11/25;G01N21/88 主分类号 G01B11/30
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