发明名称 LITHOGRAPHIC APPARATUS AND METHOD FOR REDUCING THERMAL DISTORTION
摘要 <P>PROBLEM TO BE SOLVED: To provide a lithographic apparatus compensating for the thermal non-uniformity of a patterning device. <P>SOLUTION: A lithographic apparatus has: a heater that is formed for supplying energy for heating a patterning device to the patterning device and for forming a predetermined thermal distortion pattern of the patterning device; and a controller that is formed for performing optical correction corresponding to the predetermined thermal distortion pattern in the device in order to reduce the influence of the thermal distortion of the patterning device on the pattern. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007318131(A) 申请公布日期 2007.12.06
申请号 JP20070130397 申请日期 2007.05.16
申请人 ASML NETHERLANDS BV 发明人 FINDERS JOZEF MARIA;LOOPSTRA ERIK R
分类号 H01L21/027;H01L21/683 主分类号 H01L21/027
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