发明名称 Three dimensional analyzing device
摘要 A three-dimensional analyzing device includes a first beam source for generating a first beam, a second beam source for generating a second beam, an optical system for spatially overlapping the first and second beams at least partly and irradiating the beams onto a specimen to three-dimensionally confine a photoactive region in a specimen, and a photo acceptance element for accepting a response light emitted from the photoactive region. Preferably, the device further includes an operation unit for calculating a correlation function of a response light in the time domain based on the output of the photo acceptance element to analyze a desired physical value of the specimen.
申请公布号 US7304315(B2) 申请公布日期 2007.12.04
申请号 US20060404248 申请日期 2006.04.13
申请人 JAPAN SCIENCE & TECHNOLOGY AGENCY;OLYMPUS CORPORATION;NIPPON ROPER CO., LTD. 发明人 IKETAKI YOSHINORI;FUJII MASAAKI;WATANABE TAKESHI;OMATSU TAKASHIGE;YAMAMOTO KIMIHISA;SUZUKI TOSHIO
分类号 G01N21/64;G01J3/00 主分类号 G01N21/64
代理机构 代理人
主权项
地址