发明名称 FIELD EFFECT TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To provide a high-output field effect transistor by improving withstand voltage while adopting an embedded gate structure effective for increasing a maximum drain current. SOLUTION: The field effect transistor has at least a channel layer formed of a 3-5 compd. semiconductor containing no aluminum on a semi-insulating substrate; a gate contact layer which is formed of a 3-5 compd. semiconductor containing aluminum of≤1×10<SP>16</SP>cm<SP>-3</SP>doping concentration, and having large interband energy on it; a gate embedding layer which is formed of a 3-5 compd. semiconductor containing no aluminum of≤1×10<SP>16</SP>cm<SP>-3</SP>doping concentration on it; and a gate electrode which is embedded in the gate embedding layer, and connected with the gate contact layer. The gate embedding layer is provided with a recess which surrounds the side wall, and which has a thickness of not exposing the gate contact layer. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007311684(A) 申请公布日期 2007.11.29
申请号 JP20060141257 申请日期 2006.05.22
申请人 MITSUBISHI ELECTRIC CORP 发明人 AMASUGA HIROTAKA;KUNII TETSUO
分类号 H01L21/338;H01L29/778;H01L29/812 主分类号 H01L21/338
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