发明名称 POSITIVE RESIST COMPOSITION AND METHOD OF PATTERN FORMATION WITH THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a positive resist composition and a method of pattern formation with the same, and to provide a positive resist composition improved in various performances such as pattern profile, pattern collapse and scumming and excellent also in backward contact angle of an immersion liquid and water follow-up properties, and also to provide a method of pattern formation. <P>SOLUTION: The positive resist composition comprises: (A) a resin which comes to have an enhanced solubility in an alkaline developing solution by an action of an acid; (B) a compound which generates an acid upon irradiation with actinic rays or a radiation; (C) a fluorine-containing compound containing at least one group selected from the groups (x) to (z); and (F) a solvent: (x) an alkali-soluble group; (y) a group which decomposes by an action of an alkaline developing solution to enhance a solubility in an alkaline developing solution; and (z) a group which decomposes by an action of an acid. The method of pattern formation with the composition is also provided. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007304537(A) 申请公布日期 2007.11.22
申请号 JP20060198897 申请日期 2006.07.21
申请人 FUJIFILM CORP 发明人 KANDA HIROMI;KANNA SHINICHI;INABE HARUKI
分类号 G03F7/033;G03F7/004;G03F7/039;H01L21/027 主分类号 G03F7/033
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