发明名称 PROBE ASSEMBLY
摘要 PROBLEM TO BE SOLVED: To provide an electric connection device capable of surely preventing the flexural deformation of the supporting bar when the over drive force is activated to the probe supported by a support through the supporting bar. SOLUTION: Each probe of the probe assembly is composed of platy members which are arranged in thickness direction under the support while keeping intervals. The probe is supported by a supporting bar made of electric insulation material which is supported by the support while passing through the plate thickness direction. The probe is made into a slit bar arranged on the front edge of the support and received in the slit groove opened to downward. The needle tip of the probe is arranged through each slit groove protrusively to downward. On the slit bar or the support a rigid fulcrum for restricting the deformation of probe by abutting to the probe before the probe is abutting the groove on the top surface of the slit groove. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007303834(A) 申请公布日期 2007.11.22
申请号 JP20060129333 申请日期 2006.05.08
申请人 MICRONICS JAPAN CO LTD 发明人 KUGA TOMOAKI;YASUDA TAKAO;DEWA HARUMASA;ROKUNOHE JURI
分类号 G01R1/073 主分类号 G01R1/073
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