发明名称 SEMICONDUCTOR DEVICE CAPABLE OF REDUCING INTERELECTRODE LEAK CURRENT AND MANUFACTURING METHOD THEREOF
摘要 A semiconductor device has a capacitive structure formed by sequentially layering, on a wiring or conductive plug, a lower electrode, a capacitive insulation film, and an upper electrode. The semiconductor device has, as the capacitive structure, a thin-film capacitor having a lower electrode structure composed of an amorphous or microcrystalline film or a laminate of these films formed on a polycrystalline film.
申请公布号 US2007262417(A1) 申请公布日期 2007.11.15
申请号 US20070745673 申请日期 2007.05.08
申请人 NEC CORPORATION;NEC ELECTRONICS CORPORATION 发明人 OHTAKE HIROTO;INOUE NAOYA;KUME IPPEI;TODA TAKESHI;HAYASHI YOSHIHIRO
分类号 H01L29/00 主分类号 H01L29/00
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