发明名称 |
NONVOLATILE MEMORY CELL, SEMICONDUCTOR DEVICE USING IT, AND METHOD OF FORMING NONVOLATILE MEMORY |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a non-volatilized memory cell, and a semiconductor device capable of reducing the operating currents of variable resistor elements and improving the reliability, and to provide a method of forming the nonvolatile memory cell. <P>SOLUTION: The nonvolatile memory cell is built by using a variable resistance element which is composed of a variable resistance layer 11 changing its resistance by the applied voltage and a first electrode 104 and a second electrode 102 sandwiching the variable resistance layer 11; and a capacitor 12 which has an insulator layer 105 between the first electrode 104 or the second electrode 102 and the third electrode 106. By applying a voltage to the capacitor to break it down, the resistance component of the capacitor is made almost the same as the lowered resistance of the variable resistance element. <P>COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2007293969(A) |
申请公布日期 |
2007.11.08 |
申请号 |
JP20060118877 |
申请日期 |
2006.04.24 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
GI SHIKIYO |
分类号 |
G11C13/00;H01L27/10;H01L45/00;H01L49/00 |
主分类号 |
G11C13/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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