发明名称 STATIC RANDOM ACCESS MEMORY MEANS
摘要 A static random access memory means is provided. The SRAM memory means comprises a first pass-gate FET (T6) which is coupled between a first node (A) and a bitline-bar (BLB). A second pass-gate FET (T1) is coupled between a second node (B) and a bitline (BL). The second node (B) is coupled to the first pass-gate FET (T6) and the first pass- gate FET (T6) is switched according to the voltage (V<SUB>B</SUB>) at the second node (B). The first node (A) is coupled to the second pass-gate FET (T1). The second pass-gate FET (T1) is switched according to the voltage (V<SUB>A</SUB>) on the first node (A).
申请公布号 WO2007122565(A2) 申请公布日期 2007.11.01
申请号 WO2007IB51415 申请日期 2007.04.19
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;NG, RANICK, K., M.;DOORNBOS, GERBEN;SURDEANU, RADU 发明人 NG, RANICK, K., M.;DOORNBOS, GERBEN;SURDEANU, RADU
分类号 G11C11/412 主分类号 G11C11/412
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