| 摘要 |
A system and method for testing a memory device is disclosed. One embodiment includes a plurality of memory cells. Each of the memory cells can be controlled by an address. A test memory for storing test results is provided. An address comparing unit is configured to determine whether the address of a memory cell lies in a predetermined address space. A controllable unit for storing test results is connected with the test memory and the address comparing unit. The controllable unit is controlled by the address comparing unit such that error information of the tested memory cell is only stored in the test memory if the address of the tested memory cell lies in the selected address space.
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