| 摘要 |
PROBLEM TO BE SOLVED: To constitute the conduction state between an inspecting device and a semiconductor integrated circuit to be inspected in a simple constitution, without having to enlarge the circuit. SOLUTION: The conduction recognizing device has a first buffer 30A and second buffer 30B, that have a plurality of input terminals and output terminals and allow parallel input/output of a plurality of bits. The first buffer is disposed to make respective output terminals, corresponding to a plurality of terminals to be inspected of a drive IC 11, and to simultaneously output signals from respective output terminals to respective terminals to be inspected. The second buffer is disposed, in a state where each input terminal is conducted to a branch line 35 branched from the gap between each output terminal of the first buffer and each terminal to be inspected of the drive IC, and in the grounded state of a power source terminal of the drive IC, the conduction state is determined, according to the output level of the second buffer, when an inspection signal is supplied from the first buffer to each terminal to be inspected. COPYRIGHT: (C)2008,JPO&INPIT
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