发明名称 APPARATUS FOR INSPECTING LASER BEAM PARALLELISM OR THE LIKE
摘要 <P>PROBLEM TO BE SOLVED: To provide an apparatus for inspecting laser beam parallelism or the like for stably and easily performing highly accurate inspection when inspecting parallelism of the laser beam. <P>SOLUTION: The apparatus S for inspecting the laser beam parallelism is equipped with: a laser diode LD which emits the laser beam through a collimator lens 2; an optical system 10 which generates astigmatism to the laser beam passing through the collimator lens 2; a light receiving means 15 which receives the laser beam passing through the optical system 10; and a determining means 30 which determines the parallelism of the laser beam based on an image form of the laser beam received by the light receiving means 15. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007272963(A) 申请公布日期 2007.10.18
申请号 JP20060095279 申请日期 2006.03.30
申请人 PIONEER ELECTRONIC CORP 发明人 OCHI SHUNICHI;SATO TOSHIAKI
分类号 G11B7/08;G11B7/135;G11B7/22 主分类号 G11B7/08
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