发明名称 |
APPARATUS FOR INSPECTING LASER BEAM PARALLELISM OR THE LIKE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an apparatus for inspecting laser beam parallelism or the like for stably and easily performing highly accurate inspection when inspecting parallelism of the laser beam. <P>SOLUTION: The apparatus S for inspecting the laser beam parallelism is equipped with: a laser diode LD which emits the laser beam through a collimator lens 2; an optical system 10 which generates astigmatism to the laser beam passing through the collimator lens 2; a light receiving means 15 which receives the laser beam passing through the optical system 10; and a determining means 30 which determines the parallelism of the laser beam based on an image form of the laser beam received by the light receiving means 15. <P>COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2007272963(A) |
申请公布日期 |
2007.10.18 |
申请号 |
JP20060095279 |
申请日期 |
2006.03.30 |
申请人 |
PIONEER ELECTRONIC CORP |
发明人 |
OCHI SHUNICHI;SATO TOSHIAKI |
分类号 |
G11B7/08;G11B7/135;G11B7/22 |
主分类号 |
G11B7/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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