发明名称 Phase change random access memory device having variable drive voltage circuit
摘要 A phase change memory device includes a memory array including a plurality of phase change memory cells, each phase change memory cell including a phase change material and a diode, a plurality of column selection transistors connecting bit lines connected to the phase change memory cells to corresponding data lines, and a control node connecting the data lines to a sense amplifier unit. In a write operation mode, control voltages obtained by boosting a first voltage are respectively applied to the control node and gates of the column selection transistors, and a ground voltage is applied to a word line of a selected one of the phase change memory cells. In a standby mode, word lines and bit lines connected to the phase change memory cells of the memory array are maintained at the same voltage. According to the phase change memory device and a driving method thereof, a sufficient write voltage is supplied to a write driver, a column decoder and a row decoder in the write operation mode, and a voltage lower is applied to the write driver, the column decoder and the row decoder in the read operation mode and the standby mode, thereby reducing current consumption and enhancing operational reliability.
申请公布号 US7283387(B2) 申请公布日期 2007.10.16
申请号 US20050316256 申请日期 2005.12.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO WOO-YEONG;KIM DU-EUNG;LEE KWANG-JIN;KWAK CHOONG-KEUN
分类号 G11C11/00;G11C5/14 主分类号 G11C11/00
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