发明名称 MEMORY HAVING STORAGE LOCATIONS WITHIN A COMMON VOLUME OF PHASE CHANGE MATERIAL
摘要 <p>A memory having storage locations within common volume of a phase change material is provided to increase storage density and to reduce cost of the memory by decreasing the physical size of the memory cell. A memory includes a volume of a phase change material, a first transistor and a second transistor. The first transistor is coupled to the volume of the phase change material in order to be close to a first storing location in the volume of the phase change material. The second transistor is coupled to the volume of the phase change material in order to be close to a second storing location in the volume of the phase change material. The first transistor is located on a first layer, and the second transistor is located on a second layer vertically adjacent to the first layer.</p>
申请公布号 KR20070100667(A) 申请公布日期 2007.10.11
申请号 KR20070034415 申请日期 2007.04.06
申请人 QIMONDA AG 发明人 HAPP THOMAS;NIRSCHL THOMAS;PHILIPP JAN BORIS
分类号 G11C13/02;H01L27/115 主分类号 G11C13/02
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