| 摘要 |
A multi tip clearance measurement system (12) is provided. The clearance measurement system (12) includes a sensor (28) disposed on a first object (24), wherein the sensor comprises a plurality of probe tips (62, 64, 66, 68) configured to generate signals representative of a sensed parameter corresponding to a second object (26) and a processing unit (34) configured to evaluate the signals from subsets of the sensed parameters from the probe tips (62, 64, 66, 68) to detect an outlier probe tip and to adjust a gain, or an offset of the respective outlier probe tip for estimating the clearance between the first and second objects (24, 26) based upon the signals.
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