发明名称 TEST APPARATUS AND TEST METHOD
摘要 A TEST APPARATUS (10) ACCORDING TO THE PRESENT INVENTION INCLUDES: A PLURALITY OF TEST MODULES (150), CONNECTED TO EITHER OF THE PLURALITY OF DEVICES UNDER TEST (100), FOR SUPPLYING A TEST SIGNAL TO THE CONNECTED DEVICE UNDER TEST (100) ; A PLURALITY OF CONTROL APPARATUSES (130) FOR CONTROLLING THE PLURALITY OF TEST MODULES (150), AND FOR TESTING THE PLURALITY OF DEVICES UNDER TEST (100) IN PARALLEL; AND A CONNECTION SETTING SECTION (140) FOR SWITCHING TOPOLOGY OF THE PLURALITY OF CONTROL APPARATUSES (130) AND THE PLURALITY OF TEST MODULES (150) SO THAT THE PLURALITY OF CONTROL APPARATUSES (10) CONNECT WITH THE PLURALITY OF DEVICES UNDER TEST (100) RESPECTIVELY.(FIG 1)
申请公布号 MY131932(A) 申请公布日期 2007.09.28
申请号 MYPI20041120 申请日期 2004.03.29
申请人 ADVANTEST CORPORATION 发明人 SEIJI ICHIYOSHI
分类号 G01R31/28;G01R31/3183;G01R31/319 主分类号 G01R31/28
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