发明名称 X-RAY INSPECTION SYSTEM
摘要 An x-ray inspection system ( 198 ) arranged to inspect at least one object and comprising: a source of radiation ( 200 ) a detector ( 216 ), in use, capable of detecting the radiation passing through an irradiation zone ( 214 ) and generating a periodic output of data therefrom; processing circuitry arranged to process the output generated by the detector ( 216 ); a speed determination means ( 228 ) arranged, in use, to determine and output to the processing circuitry the speed at which an object passes the detector ( 216 ); wherein the processing circuitry is arranged to vary the period of the output of the detector ( 216 ) according to the output from the speed determination means ( 228 ).
申请公布号 US2007223656(A1) 申请公布日期 2007.09.27
申请号 US20060536254 申请日期 2006.09.28
申请人 METTLER-TOLEDO SAFELINE X-RAY LIMITED 发明人 GUSTERSON STEVE
分类号 G21K5/10 主分类号 G21K5/10
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