发明名称 CHIP FOR INSPECTION
摘要 PROBLEM TO BE SOLVED: To provide a chip for inspection to stably fix a first antibody on a chip surface. SOLUTION: This chip 10 for inspection is used for measuring a specific substance contained in a specimen by thereon depositing the specimen. This chip 10 comprises a flat-plate stick-shaped substrate 2 made of quartz glass and film-like PDMS 4 provided on an end-side upper surface of the substrate 2 with a recess formed in its middle. The first antibody is fixed in the recess of the PDMS 4. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007248433(A) 申请公布日期 2007.09.27
申请号 JP20060076415 申请日期 2006.03.20
申请人 FUNAI ELECTRIC CO LTD 发明人 MATSUI TSUTOMU
分类号 G01N33/545 主分类号 G01N33/545
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