发明名称 METHOD OF FORMING A DUAL DAMASCENE STRUCTURE
摘要 An improved method of forming an integrated circuit that includes a dual damascene interconnect is described. A contact via hole is formed in a dielectric layer disposed above a semiconductor substrate. A protective layer is disposed on top of the dielectric layer and in the contact via hole, and subsequently forming as a recessed plug in the via, followed by etching to form a trench to complete formation of a dual damascene opening.
申请公布号 US2007212877(A1) 申请公布日期 2007.09.13
申请号 US20070748574 申请日期 2007.05.15
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 HO BANG-CHEIN;CHEN JIAN-HONG;OU-YANG D.J.
分类号 H01L21/4763;H01L21/768 主分类号 H01L21/4763
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