发明名称 MISREGISTRATION INSPECTION MECHANISM OF SUBSTRATE, PROCESSING SYSTEM, AND MISREGISTRATION INSPECTION METHOD OF SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To reliably detect a misregistration of a substrate held by a transport arm. SOLUTION: The misregistration inspection mechanism comprises a plurality of substrate detection sensors 62A, 62B for detecting a presence of a substrate G. A transport arm 52 can be configured to move to a first holding position Pa3 which holds the substrate G to a first inspecting position Pg3 when the transport arm 52 holds the substrate G regularly, and a second holding position Pa4 which holds the substrate G to a second inspecting position Pg4 when the transport arm 52 holds the substrate G regularly. The plurality of substrate detection sensors 62A, 62B respectively detect a portion which differs from each other in an edge of the substrate G disposed in the first inspecting position Pg3, and are disposed so as not to detect the substrate G disposed in the second inspecting position Pg4. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007227781(A) 申请公布日期 2007.09.06
申请号 JP20060048775 申请日期 2006.02.24
申请人 TOKYO ELECTRON LTD 发明人 KOBAYASHI HIROAKI
分类号 H01L21/68;H01L21/67 主分类号 H01L21/68
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