A method of processing a probe element includes (a) providing a probe element comprising a first conductive material, and (b) coating only a tip portion of the probe element with a second conductive material.
申请公布号
KR20070083542(A)
申请公布日期
2007.08.24
申请号
KR20077005286
申请日期
2007.03.05
申请人
SV PROBE PTE LTD.
发明人
TUNABOYLU BAHADIR;MALANTONIO EDWARD L.;BEATSON DAVID T.;HMIEL ANDREW