发明名称 Delamination resistant semiconductor film and method for forming the same
摘要 A method and structure for preventing film delamination provide for forming a thick film then partitioning the thick film into a plurality of discrete portions prior to subsequent thermal processing operations. The partitioning alleviates the effects of film stress at the interface between the film and the underlying material and prevents delamination during the subsequent thermal cycling operations, that take place subsequent to the formation of the film. The partitioned film includes a pattern density of at least about 80 percent and the discrete portions do not individually serve as device structures.
申请公布号 US2007197005(A1) 申请公布日期 2007.08.23
申请号 US20060358650 申请日期 2006.02.21
申请人 CHANG YUH-HWA;CHUNG MING-TAI;WENG JUI-CHUN;LIN MING-YI 发明人 CHANG YUH-HWA;CHUNG MING-TAI;WENG JUI-CHUN;LIN MING-YI
分类号 H01L21/00 主分类号 H01L21/00
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