发明名称 LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
摘要 <p>A lithography apparatus and a device manufacturing method are provided to apply a large clamping force without the deformation of a patterning device by using an improved holder structure composed of a first and a second holders arranged at both sides of the patterning device. A lithography apparatus includes a support body, a projection system, a first holder and a second holder. The support body supports a patterning device which is capable of endowing a cross-section of a radiation beam with a predetermined pattern. The projection system(PS) is used for projecting the patterned radiation beam onto a target portion of a substrate. The first holder keeps the patterning device on a first surface of the patterning device. A second holder retains the patterning device on a second surface of the patterning device. A vacuum clamp is used as the first and the second holders.</p>
申请公布号 KR20070082033(A) 申请公布日期 2007.08.20
申请号 KR20070014710 申请日期 2007.02.13
申请人 ASML NETHERLANDS B.V. 发明人 LUTTIKHUIS BERNARDUS ANTONIUS JOHANNES;LOOPSTRA ERIK ROELOF;VAN DER SCHOOT HARMEN KLAAS;JACOBS FRANSICUS MATHIJS
分类号 H01L21/027 主分类号 H01L21/027
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