发明名称 Method and apparatus for fabricating semiconductor chips using varying areas of precision
摘要 A system that fabricates a semiconductor chip. The system places patterns for components which require fine line-widths within a high resolution region of a reticle, wherein the high resolution region provides sharp focus for a given wavelength of light used by the lithography system. At the same time, the system places patterns for components which do not require fine line-widths outside of the high-resolution region of the reticle, thereby utilizing the region outside of the high-resolution region of the reticle instead of avoiding the region. Note that the coarseness for components placed outside of the high resolution region of the reticle is increased to compensate for the loss of optical focus outside of the high resolution region.
申请公布号 US2007190432(A1) 申请公布日期 2007.08.16
申请号 US20060355757 申请日期 2006.02.16
申请人 DOUGLAS DAVID C;HO RONALD;DROST ROBERT J 发明人 DOUGLAS DAVID C.;HO RONALD;DROST ROBERT J.
分类号 G03F1/00;G03C5/00 主分类号 G03F1/00
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