发明名称 CHEMICAL MECHANICAL POLISHING SYSTEM
摘要 <p>A CMP system is provided to eliminate the necessity for installing a dummy wafer station in a position except a wafer cassette loading/unloading part. A wafer is chemically and mechanically polished by a polishing part(500). The wafer is cleaned by a cleaning part(300). A factory interface robot(200) transfers the wafer between a wafer cassette loading/unloading part(100) and the cleaning part. A dummy wafer is stored in a dummy wafer station adjacent to the factory interface robot. A wet robot(400) transfers the wafer between the polishing part and the cleaning part.</p>
申请公布号 KR20070080531(A) 申请公布日期 2007.08.10
申请号 KR20060011900 申请日期 2006.02.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, MI SEOK;CHO, JUNG HYUN;KWON, YOUNG MIN;KIM, HAE CHUL;SUNG, SOON HWAN;PARK, JUN HO
分类号 H01L21/304;H01L21/677 主分类号 H01L21/304
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