| 摘要 |
PROBLEM TO BE SOLVED: To shorten test time, while suppressing increase in circuit scale. SOLUTION: In test mode setting, with all channels selected by a selector 12, a test signal is inputted from a test pin 13 to the selector 12 on its subsequent state side. Furthermore, with selectors 14 and 15 turned ON while selectors 16 and 17 turned OFF, the selectors being provided on a signal route, the test signal outputted from the selector 12 is inputted into a measurement circuit 18a via the selector 14, while the signal measured by the measurement circuit 18a is outputted via the selector 15 from an input/output pin 11a. COPYRIGHT: (C)2007,JPO&INPIT
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