METHOD AND DEVICE FOR ANALYZING STRESS/DISTORTION

摘要

PROBLEM TO BE SOLVED: To provide a method and device for analyzing stresses, allowing more detailed stress measurement exceeding beyond the limit of the principle of photoelasticimetry. SOLUTION: In measuring the stress state of an object, by using not only the photoelasticimetry but also the stress measurement (stress luminescence measurement) by using a stress luminescent material, component valuesσ1andσ2of main stress, for example, can be known beyond the principled limit of the photoelasticimetry, and detailed stress measurement is allowed. COPYRIGHT: (C)2007,JPO&INPIT