SYSTEM AND METHOD FOR COMBINATORIAL TEST GENERATION IN A COMPATIBILITY TESTING ENVIRONMENT,申请号EP20020736978-传众专利搜索

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发明名称	SYSTEM AND METHOD FOR COMBINATORIAL TEST GENERATION IN A COMPATIBILITY TESTING ENVIRONMENT
摘要
申请公布号	EP1388064(B1)	申请公布日期	2007.08.01
申请号	EP20020736978	申请日期	2002.05.15
申请人	SUN MICROSYSTEMS, INC.	发明人	ARBOUZOV, LEONID, M.;BOBROVSKY, KONSTANTIN, S.
分类号	G06F11/36	主分类号	G06F11/36
代理机构		代理人
主权项
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