发明名称 SOCKET TERMINAL OF BGA(BALL GRID ARRAY) TEST SOCKET
摘要 A socket terminal of a BGA(Ball Grid Array) test socket is provided to improve reliability of a BGA burn-in test by including a plurality of contacts in the first contactor and additional contacts in the second contactor. A BGA device is mounted on a test socket. A lead guide board is connected to a contact pin of the test socket. The first socket terminal is connected to the lead guide board. The second socket terminal(230) is connected to a pin of the first socket terminal. A burn-in test board is connected to the second socket terminal. The first socket terminal includes the first socket terminal housing and the first socket terminal pin(223), wherein the first socket terminal pin has a circular section. The second socket terminal includes the second socket terminal housing and the second socket terminal pin(233). A contactor of the second socket terminal housing is connected to the first socket terminal pin and divided into a plurality of poles.
申请公布号 KR100744997(B1) 申请公布日期 2007.07.26
申请号 KR20060046340 申请日期 2006.05.24
申请人 KIM, DAE SOO;D.I CORPORATION 发明人 KIM, DAE SOO;KWON, NAM HOON
分类号 H01R33/76;H01L21/66;H01L23/32 主分类号 H01R33/76
代理机构 代理人
主权项
地址