发明名称 Zeolite sol and method for preparing the same, composition for forming porous film, porous film and method for forming the same, interlevel insulator film, and semiconductor device
摘要 The present invention provides a zeolite sol which can be formed into a porous film that can be thinned to an intended thickness by a method used in the ordinary semiconductor process, that excels in dielectric properties, adhesion, film consistency and mechanical strength, and that can be easily thinned; a composition for film formation; a porous film and a method for forming the same; and a high-performing and highly reliable semiconductor device which contains this porous film inside. More specifically, the zeolite sol is prepared by hydrolyzing and decomposing a silane compound expressed by a general formula: Si(OR<SUP>1</SUP>)<SUB>4 </SUB>(wherein R<SUP>1 </SUP>represents a straight-chain or branched alkyl group having 1 to 4 carbons, and when there is more than one R<SUP>1</SUP>, the R<SUP>1</SUP>s can be independent and the same as or different from each other) in a conventional coating solution for forming a porous film in the presence of a structure-directing agent and a basic catalyst; and then by heating the silane compound at a temperature of 75° C. or lower. A composition for forming a porous film which contains this zeolite sol is used.
申请公布号 US7244657(B2) 申请公布日期 2007.07.17
申请号 US20030703854 申请日期 2003.11.07
申请人 SHIN-ETSU CHEMICAL CO. LTD.;MATSUSHITA ELECTRIC IND CO LTD 发明人 OGIHARA TSUTOMU;YAGIHASHI FUJIO;NAKAGAWA HIDEO;SASAGO MASARU
分类号 H01L21/76;C01B39/04;C23C16/00;H01L21/312;H01L21/316;H01L21/768;H01L23/522 主分类号 H01L21/76
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