发明名称 |
Zeolite sol and method for preparing the same, composition for forming porous film, porous film and method for forming the same, interlevel insulator film, and semiconductor device |
摘要 |
The present invention provides a zeolite sol which can be formed into a porous film that can be thinned to an intended thickness by a method used in the ordinary semiconductor process, that excels in dielectric properties, adhesion, film consistency and mechanical strength, and that can be easily thinned; a composition for film formation; a porous film and a method for forming the same; and a high-performing and highly reliable semiconductor device which contains this porous film inside. More specifically, the zeolite sol is prepared by hydrolyzing and decomposing a silane compound expressed by a general formula: Si(OR<SUP>1</SUP>)<SUB>4 </SUB>(wherein R<SUP>1 </SUP>represents a straight-chain or branched alkyl group having 1 to 4 carbons, and when there is more than one R<SUP>1</SUP>, the R<SUP>1</SUP>s can be independent and the same as or different from each other) in a conventional coating solution for forming a porous film in the presence of a structure-directing agent and a basic catalyst; and then by heating the silane compound at a temperature of 75° C. or lower. A composition for forming a porous film which contains this zeolite sol is used.
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申请公布号 |
US7244657(B2) |
申请公布日期 |
2007.07.17 |
申请号 |
US20030703854 |
申请日期 |
2003.11.07 |
申请人 |
SHIN-ETSU CHEMICAL CO. LTD.;MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
OGIHARA TSUTOMU;YAGIHASHI FUJIO;NAKAGAWA HIDEO;SASAGO MASARU |
分类号 |
H01L21/76;C01B39/04;C23C16/00;H01L21/312;H01L21/316;H01L21/768;H01L23/522 |
主分类号 |
H01L21/76 |
代理机构 |
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地址 |
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