发明名称 |
Bypassing a device in a scan chain |
摘要 |
Methods and systems for testing devices in a scan chain are described. A first device for test and a second device for test are coupled in the scan chain. A signal selector is coupled between the first and second devices. The signal selector selects between an output signal that is output from the first device and a bypass signal that has bypassed the first device.
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申请公布号 |
US7246282(B2) |
申请公布日期 |
2007.07.17 |
申请号 |
US20030607159 |
申请日期 |
2003.06.25 |
申请人 |
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. |
发明人 |
CHAU ANDREW;BHAGWATH NITIN |
分类号 |
G01R31/28;G01R31/3185;G06F11/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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