发明名称 PHOTOSENSOR FINE DOMAIN POTENTIAL MEASURING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To solve the problems inherent in a system wherein a fine laser spot is exposed onto a photosensor charged at a high potential, to thereby generate a surface potential change on a fine domain portion, and a change of the charge quantity induced on an electrode by the potential change, namely, an induced current (displacement current), is measured and the surface potential level before exposure is known from the magnitude of a signal, to put it concretely, to provide a measuring device wherein a gap between the photosensor and the electrode is maintained by a simple method, concerning a device wherein a potential measuring method of a fine domain utilizing optical attenuation is improved. <P>SOLUTION: In this fine domain potential measuring device holding a photosensor drum, and having a rotating mechanism, wherein an electrifier, a surface potentiometer probe, an image writer, a potential change detection transparent electrode (flat plate) plus a laser exposure, and a static eliminator are arranged in this order in the drum rotation direction around the photosensor, each roller having an insulating surface is installed on both sides of a frame of the transparent electrode, and each roller is in contact with the photosensor surface, and the transparent electrode is in a noncontact state. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007178322(A) 申请公布日期 2007.07.12
申请号 JP20050378428 申请日期 2005.12.28
申请人 RICOH CO LTD 发明人 MASUDA KIYOSHI
分类号 G01R29/12;G03G15/00;G03G15/04;G03G15/043 主分类号 G01R29/12
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