发明名称 WAFER-TYPE TEMPERATURE SENSOR, TEMPERATURE-MEASURING APPARATUS USING THE SAME, HEAT TREATMENT APPARATUS HAVING TEMPERATURE-MEASURING FUNCTION, AND TEMPERATURE-MEASURING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a wafer-type temperature sensor of a simple circuit capable of eliminating the need for supply of electric power, adapting to automation, improving resistance to heat, and measuring the temperature distribution of a wafer. <P>SOLUTION: The wafer-type temperature sensor 10 is provided with the wafer 1 and a plurality of temperature sensors 2a, 2b, ..., each being arranged with the upper surface of the wafer 1 partitioned into a plurality of regions. The temperature sensors 2a, 2b, ... are each provided with a surface acoustic wave device for sending back frequency signals, based on the temperature of a corresponding region within a frequency band different region by region, in response to input of high-frequency signals. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007171047(A) 申请公布日期 2007.07.05
申请号 JP20050370811 申请日期 2005.12.22
申请人 TOKYO ELECTRON LTD 发明人 SATA NOBUYUKI;KITANO TAKAHIRO;FUKUOKA TETSUO;MATSUMOTO TOSHIYUKI;MINAMI TOMOHIDE
分类号 G01K7/32;G01K1/02;G01K1/14;G08C17/00;H01L21/66 主分类号 G01K7/32
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