发明名称 Low stress stacked die packages
摘要 A stacked die package comprises a first die on a substrate, a die attach layer superjacent to the first die, and a second die on the die attach layer. The die attach layer comprises a die attach material having a glass transition temperature substantially in the range of 150-180° C. Raising the glass transition temperature reduces the mismatch in the coefficients of thermal expansion (CTE) between the die attach and the mold compound that surrounds the first die in the package.
申请公布号 US2007152314(A1) 申请公布日期 2007.07.05
申请号 US20050323204 申请日期 2005.12.30
申请人 INTEL CORPORATION 发明人 MANEPALLI RAHUL;EITAN AMRAM;RAGHAVAN PRASANNA
分类号 H01L23/02;H01L21/50 主分类号 H01L23/02
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