发明名称 AN APPARATUS AND A METHOD FOR NON-INVASIVE MEASUREMENT BY MULTIPLE WAVELENGTH
摘要 A non-invasive measuring method and apparatus using multiple wavelengths are provided to measure a characteristic degree of accurate materials by compensating a measuring error of an incident wave and a transmitted wave. A non-invasive measuring apparatus using multiple wavelength includes a signal generator(10), a signal detector(20), and a characteristic degree extractor(30). The signal generator irradiates at least two multiple signals having different wavelengths to a medium. The signal detector detects a signal having a first wavelength passing target materials to measure a first characteristic degree of the target material, and detects a signal having a second wavelength to measure a second characteristic degree of the target material. The characteristic degree extractor compares the first characteristic degree of the target material and the second characteristic degree of the target material, and measures a relative characteristic degree of the target material.
申请公布号 KR20070071912(A) 申请公布日期 2007.07.04
申请号 KR20050135757 申请日期 2005.12.30
申请人 HARMONIX CO., LTD. 发明人 KIM, SUNG UK;MIN, WI SIK;KIM, YOUNG SUK;LEE, SEE DONG
分类号 G01N21/27 主分类号 G01N21/27
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