发明名称 |
Binary halftone detection |
摘要 |
A method to detect frequency and angle of a binary halftone pattern. The method employs an exclusive-or operation which is applied locally to a region of a binary bit map and its spatially shifted version. The resulting bits from the exclusive-or operation are summed over the region. The exclusive-or operation is repeated for a range of shift values. In a halftone region, the shift at which the minimum sum occurs reflects the angle and the frequency of the halftone.
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申请公布号 |
US7239430(B2) |
申请公布日期 |
2007.07.03 |
申请号 |
US20020318614 |
申请日期 |
2002.12.12 |
申请人 |
XEROX CORPORATION |
发明人 |
SHIAU JENG-NAN;LIN YING-WEI |
分类号 |
H04N1/405;G06K9/20;H04N1/40 |
主分类号 |
H04N1/405 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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