| 摘要 |
An apparatus for generating input data for a semiconductor memory device is provided to simply generate various test patterns by changing input data through a column address in a data compression test mode. An apparatus(140) for generating input data for a semiconductor memory device includes at least one first input data driver receiving external data in a data compression test mode and at least one second input data driver not receiving external data in the data compression test mode. The first input data driver generates test data using the external data. The second input data driver controls the logic level of the test data provided from the first input data driver in response to a pattern control signal. The pattern control signal is a column address signal.
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