发明名称 MULTIPLE ANGLE MEASURING SYSTEM AND METHOD FOR DISPLAY
摘要 <P>PROBLEM TO BE SOLVED: To provide a technique for detecting quantitative unevenness, which carries out a pickup operation for unevenness phenomenon, by using a multi-angle imaging mechanism and is coupled with processing programs for unevenness image-analyzing and unevenness identifying/classifying operations, and to provide userfriendly interface and interactive searching functions by making up a quality interactive processing/analyzing database. <P>SOLUTION: A multiple angle measuring system is provided with unevenness (mottles) imaging unit, an unevenness image processing unit and a database unit. The pickup operation for the unevenness phenomenon is carried out during a displaying operation, by using the multi-angle imaging mechanism, and then the unevenness image analyzing and identifying/classifying operations are carried out by using an unevenness image processing program, thereby providing the technique for detecting the quantitative unevenness; and then the quality interactive processing/analyzing database is constructed. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007163450(A) 申请公布日期 2007.06.28
申请号 JP20060036263 申请日期 2006.02.14
申请人 CHUKAMINKOKU TAIWAN HAKUMAKU DENSHOTAI EKISHO KEIJIKI SANGYO KYOKAI;CHUNGHWA PICTURE TUBES LTD;AU OPTRONICS CORP;QUANTA DISPLAY INC;HANNSTAR DISPLAY CORP;CHI MEI ELECTRONICS CORP;IND TECHNOL RES INST;TOPPOLY OPTOELECTRONICS CORP 发明人 SAI IYU;ON SHOKA;TEI SEIKAN;RYU TSUHATSU;U KOTO
分类号 G01N21/88;G01M11/00;G02F1/13;G06T1/00 主分类号 G01N21/88
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