发明名称 Method of etching for multi-layered structure of semiconductors in groups III-V and method for manufacturing vertical cavity surface emitting laser device
摘要 Provided are an etching method for a multi-layered structure of semiconductors in groups III-V and a method of manufacturing a VCSEL using the etching method. According to the etching method, a stacked structure including a first semiconductor layer and a second semiconductor layer is exposed to a plasma of a mixture consisting of Cl<SUB>2</SUB>, Ar, CH<SUB>4</SUB>, and H<SUB>2 </SUB>to etch the stacked structure, so that a mirror layer of the VCSEL is formed. The first semiconductor layer is formed of a semiconductor in groups III-V and the second semiconductor layer is formed of a semiconductor in groups III-V, other than the semiconductor of the first semiconductor layer. At least part of a lower mirror layer, a lower electrode layer, an optical gain layer, an upper electrode layer, and an upper mirror layer is etched using one time of an etching process, so that a clean and smooth etched surface is obtained.
申请公布号 US2007134926(A1) 申请公布日期 2007.06.14
申请号 US20060635223 申请日期 2006.12.07
申请人 KWON O KYUN;PARK MI RAN;HAN WON SEOK;SONG HYUN WOO 发明人 KWON O. KYUN;PARK MI RAN;HAN WON SEOK;SONG HYUN WOO
分类号 H01L21/302 主分类号 H01L21/302
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