发明名称 DOUBLE END DISPLACEMENT TYPE CONTACT PROBE
摘要 <p>A double end displacement type contact probe is easily assembled to compatibly ensure stable displacements at both ends of the probe and electrically contacting functions. The double end displacement type contact probe is provided with first, second and third electrically conductive members (11), (12) and (13) and a hollow elastic member (13). The first and second electrically conductive members (11) and (12) function as electrically contacting members, respectively. When the first and second electrically conductive members (11) and (12) are close to each other along their axial direction from a gap defined between them, the elastic member (13) energizes the first and second electrically contacting members (11) and (12) in such a direction to enlarge the gap. The elastic member (13) receives the third electrically conductive member (14) extending along the axial direction. The elastic member (13) has one terminal portion (13a) holding and connecting the first electrically conductive member (11), another terminal portion (13b) holding and connecting the second electrically conductive member (12), and a middle portion (13c) holding the third electrically conductive member (14) in a shape slidable to the first and second electrically conductive members (11) and (12). The elastic member (13) may be a coil spring in which spring portions on both sides of the middle portion (13c) is different in free length and coil pitch from each other.</p>
申请公布号 WO2007066382(A1) 申请公布日期 2007.06.14
申请号 WO2005JP22326 申请日期 2005.12.06
申请人 UNITECHNO INC.;NAKAMURA, SHINICHI 发明人 NAKAMURA, SHINICHI
分类号 G01R1/067 主分类号 G01R1/067
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