SOLID-STATE IMAGING DEVICE

摘要

Fixed pattern noise (FPN) is reduced and area increase of an image cell is suppressed. A photoelectric conversion signal is generated from a photo current flowing in a photodiode (PD) in a pixel (Ca). A first transistor (T1) functioning as a load transistor is driven to operate within a sub-threshold region after being operated in strong inversion status. The potential of a sense node (N1) is read as a reset signal while the first transistor (T1) is operating within the sub-threshold region. Then, an image signal (Vs) is generated by calculating the difference between the photoelectric conversion signal and the reset signal.