A method for manufacturing a semiconductor device is provided to shorten a process time and reduce a manufacturing cost by simplifying a planarization process. A cylindrical capacitor(260) is formed on a cell region(C) of a semiconductor substrate(200) including the cell region and a peripheral region(P). An interlayer dielectric(270) is formed on the semiconductor substrate. An amorphous carbon layer(280) is formed on the interlayer dielectric. A first CMP process using a first slurry is performed to polish the amorphous carbon layer of the cell region and a part of the interlayer dielectric. A second CMP process using a second slurry is performed to remove the amorphous carbon layer of the peripheral region and to planarize the interlayer dielectric of the cell region and the peripheral region.
申请公布号
KR20070060347(A)
申请公布日期
2007.06.13
申请号
KR20050119654
申请日期
2005.12.08
申请人
HYNIX SEMICONDUCTOR INC.
发明人
PARK, HYUNG SOON;JUNG, JONG GOO;PARK, JUM YONG;SHIN, JONG HAN;RYU, CHEOL HWI